Texas Instruments LMK0480x Low-Noise Clock Jitter Cleaner
Texas Instruments LMK0480x Low-Noise Clock Jitter Cleaner is a high-performance clock conditioner that includes superior clock jitter cleaning, generation, and distribution with advanced features to meet next-generation system requirements. The dual loop PLLatinum™ architecture enables 111fs RMS jitter (12kHz to 20MHz) using a low noise VCXO module or sub-200fs RMS jitter (12kHz to 20MHz) using a low-cost external crystal and varactor diode. The dual loop architecture consists of two high-performance phase-locked loops (PLL), a low-noise crystal oscillator circuit, and a high-performance voltage-controlled oscillator (VCO). The first PLL (PLL1) provides a low-noise jitter cleaner function. The while the second PLL (PLL2) performs the clock generation.Features
- Ultra-low RMS jitter performance
- 111fs RMS jitter (12kHz to 20MHz)
- 123fs RMS jitter (100Hz to 20MHz)
- Dual loop PLLatinum™ PLL architecture
- PLL1
- Integrated low-noise crystal oscillator circuit
- Holdover mode when input clocks are lost
- Automatic or manual triggering/recovery
- PLL2
- Normalized PLL noise floor of -227dBc/Hz
- Phase detector rate up to 155MHz
- OSCin frequency-doubler
- Integrated low-noise VCO
- 2 Redundant input clocks with LOS
- Automatic and manual switch-over modes
- 50% Duty cycle output divides, 1 to 1045 (even and odd)
- 12 LVPECL, LVDS, or LVCMOS programmable outputs
- Digital delay: fixed or dynamically adjustable
- 25ps Step analog delay control
- 14 Differential outputs with up to 26 single-ended
- Up to 6 VCXO/crystal buffered outputs
- Clock rates of up to 1536MHz
- 0 Delay mode
- Three default clock outputs at power-up
- Multi-mode: dual PLL, Single PLL, and clock distribution
- -40 to 85°C Industrial temperature range
- 3.15V to 3.45V Operation
- 2 Dedicated buffered/divided OSCin clocks
- 64-Pin WQFN (9.0mm × 9.0mm × 0.8mm) package
Applications
- Data converter clocking
- Wireless infrastructure
- Networking, SONET/SDH, DSLAM
- Medical / video / military / aerospace
- Test and measurement
Simplified Schematic
Pubblicato: 2015-12-14
| Aggiornato: 2024-01-15
